Abstract
Thin films of Zn1−xNdxO were deposited by spray pyrolysis on Si(111) substrates preheated at 400°C temperature and were studied as a function of neodymium (Nd)-doping concentration. X-ray diffraction (XRD) patterns confirmed that the deposited films possess hexagonal wurtzite ZnO structure. Further, it is observed that the doped films show a preferential orientation along the c-axis (002), which is perpendicular to the substrate. The un-doped films seem to be having a bit low-crystallinity, which is corroborated by the scanning electron microscope (SEM) analysis that showed nano-crystalline like features. Further, SEM analysis showed that the Nd doping triggers the formation bubble-like structure on top of the nano-crystalline structure. The SEM microstructures are interpreted with the Micro-Raman studies. Photoluminescence (PL) and XRD characterizations indicate that above 5at.% doping concentrations, the Nd atoms preferentially agglomerate in the large islands.
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