Abstract
Porous silicon layers have been prepared from n-type silicon wafers of (100) orientation. SEM, XRD, FTIR, and PL have been used to characterize the morphological and optical properties of porous silicon. The influence of varying HF concentration in the anodizing solution, on structural and optical properties of porous silicon has been investigated. It is observed that pore size increases with HF:ethanol concentration ratio and attain maximum for 1:2 ratio and then decreases.
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