Abstract
Pure BiFeO3 (BFO) and rare earth (RE) ion co-doped (Bi0.9RE0.1)(Fe0.975Mn0.025)O3 (RE = Sm, Tb and Ho, denoted by BSFM, BTFM and BHFM) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by using a chemical solution deposition method. Formations of distorted rhombohedral perovskite structure for the thin films were confirmed by using an X-ray diffraction and a Raman scattering analysis. Microstructural features for the thin films were examined by using a scanning electron microscopic analysis. Among the thin films, the lowest leakage current density of 1.22 × 10−6 A/cm2 (at 100 kV/cm), large remnant polarization (2Pr) of 72.4 μC/cm2 and low coercive field (2E c ) of 689 kV/cm (at 980 kV/cm) were measured for the BTFM thin film.
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