Abstract
The structural and electronic properties of epitaxial graphene on SiC(0001) are investigated by low energy electron diffraction (LEED) and angle resolved ultraviolet photoelectron spectroscopy (ARUPS). Fingerprints in the spot intensity spectra in LEED allow for the exact determination of the number of layers for the first three graphene layers after being correlated with the electronic bandstructure obtained from ARUPS using He II excitation. Our analysis includes the consideration of samples with different doping levels. A possible influence of the polytype 4H- or 6H-SiC is discussed. LEED by itself turns out to be an easy and practical method for the thickness analysis of epitaxial graphene on SiC(0001).
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