Abstract
Au-SiO x cermet films with different gold contents (20–80%) have been produced by vacuum deposition at substrate temperatures between 25° and 400°C. The changes in structure and electrical properties which take place during heat treatment have been studied by electron diffraction and stereo electron microscopy. In situ electron microscopy allows the simultaneous observation of structural reordering and variations in the electrical resistivity of the film. The coagulation of gold caused by the reordering processes during the heat treatment is affected by the deposition conditions. The distribution of the gold islands in the thickness of the film has been investigated by stereo electron microscopy. Relations between the morphology and the electrical properties—sheet resistance, temperature coefficient and frequency dependence of the resistance—of the cermet films were obtained.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
