Structural and dispersion parameters of nano-layers prepared from Al-Ni-Cr alloy

Abstract

In this study, Al-Ni-Cr nano-layers with various thicknesses (1-layer (90 nm), 1-layer (25 nm) two 1- layer, because the weight varies, in the first case a weight of 0.035 g and the second case of a weight of 0.009 g. 2-layers (40 nm), 3-layers (65 nm)), (thickness was measured using weighting method and the optical interferometer method by Lambda LIMF-10 device), which was made by using the thermal evaporation technique on glass substrates at a pressure of 10−7 mbar. It was observed that the surface of the films was a uniform, homogeneous structure, soft, and no pinholes and crakes from the AFM test. The reflectivity of nanofilms examines using 635 nm and 532 nm laser wavelength. The reflectance reached 98% for t1 and t2 for 635 nm and 99% for the wavelength of 532 nm. The dispersion parameters were calculated using the Wemple–DiDomenico method. The single oscillator energy of electronic transition (Eo) and the dispersion energy (Ed) both reduced as layer thickness increased. Reflective and executed films have very small energy gap values. The electrical properties of the (Al-Ni-Cr) thin films were primarily investigated through conductivity measurements. This shows that the Al-Ni-Cr thin films behave as a conductor. It’s noticed from the study of electrical properties (electrical resistivity), Al-Ni-Cr nanofilms may be suitable to fabricate electrical circuits with high conductivity.