Abstract
We have studied ion-induced electron emission from bent KCl and NaCl crystals while they are being bombarded by 7 MeV H +. A cylindrical mirror electron analyzer of wide angular acceptance allowed low beam-dose measurements of the high-energy shadowing effect with negligible influence from radiation damage. In most cases, the shadowing patterns exhibit coexistence of clear and smeared planar images of the crystal planes, indicating the preferential distribution of edge dislocations induced in the process of bending caused by the cleavage of the crystals. The present work demonstrates the practical use of ion-induced electron emission for material characterization under extremely low beam-induced damage.
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