Abstract
In response to the development of new materials and the application of materials and components in new technologies the direct measurement, calculation and evaluation of textures and residual stresses has gained worldwide significance in recent years. STRESS-SPEC, the materials science diffractometer, which is jointly operated by the Technische Universität München, the Institute of Materials Science and Engineering, Technische Universität Clausthal and by GEMS, Helmholtz-Zentrum Geesthacht, is located at the thermal beam port SR-3 of the FRM II and can easily be configured either for texture analysis or strain measurements.
Highlights
The set-up utilises three di erent monochromators: Ge (511), bent silicon Si (400) and pyrolitic graphite PG(002)
The gauge volume de ning optical system of primary and secondary slits is designed with regard to reproducibility of geometrical alignment and sturdiness
Both slit systems are linked to the sample table and the detector in such a way that the center of the beam remains the same under all conditions
Summary
The set-up utilises three di erent monochromators: Ge (511), bent silicon Si (400) and pyrolitic graphite PG(002) This selection of monochromators and the possibility to vary automatically the take-o angles from 2ΘM = 35o to 110o allows to nd a good compromise between resolution and intensity for each measuring problem. The gauge volume de ning optical system of primary and secondary slits is designed with regard to reproducibility of geometrical alignment and sturdiness. Both slit systems are linked to the sample table and the detector in such a way that the center of the beam remains the same under all conditions. The possibility to scan surfaces of components o ine using a CMM laser scanner is available at STRESS-SPEC
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