Abstract
The stress fields induced by a dislocation and its image dislocations around a narrow elliptic void are formulated. Based on the solution, the stress distribution and effective stress intensity factor of a blunt (elliptic) crack were calculated under mode I constant loading. The results show that a dislocation-free zone (DFZ) is formed after dislocation emission. There exists a second stress peak in the DFZ except a stress peak at the blunt crack tip. With an increase in the applied stress intensity factorKla or the friction stress τf of the material, the DFZ size and the peak stress at the crack tip decrease, but the peak stress in the DFZ and the effective stress intensity factorKif presiding at the crack tip increase. Because of dislocation shieldiing, effects, shielding ratioKla/Kif increases with increasingKla, but it decreases with increasing τf.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call