Abstract
High quality CdTe bulk crystals are difficult to obtain due to various types of defects such as twins, dislocations, inclusions, and sub-grain boundaries. In this paper, the influence of different dopants and growth conditions on formation, frequency, and stereometry of those defects are discussed. The crystals have been grown by means of a sublimation travelling heater method (STHM) using Bridgman seeds. As dopants, the halogens chlorine, bromine, and iodine as well as vanadium and titanium have been used. By means of quantitative near-IR polarizing microscopy, the mapping of long-range stress fields can be related to irregularities in crystal growth. Additionally, local stress birefringence induced by dislocations and inclusions has been observed. The occurrence of crystal perturbations in STHM and Bridgman material is compared.
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