Abstract
The integral approach of Cook and Erdogan was used to obtain the asymptotic behaviour of a crack close to a bimaterial interface. It was found that, in addition to the square-root singularity which dominates the stresses in the vicinity of a conventional crack, there are two additional contributions to stress which should not be neglected. One contribution is due to an “image singularity” and the second is due to an O(1) term which can become very large for small tip to interface distances. It is shown how these features of the stress distribution can be used to advantage in the numerical calculation of stress intensity factors.
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