Stress Affection of Two Scale Truncated Generalized Logistic Parameters with Progressive Censoring

Salma Omar Bleed,Abdallah Mohamed Abdelfattah

doi:10.18187/pjsor.v13i3.1427

Abstract

This paper deals with non-Bayesian estimation problem of constant-stress Accelerated Life Tests (ALTs) when the lifetime of the items follow truncated Generalized Logistic Distribution (GLD). Some considerations on inference based on the use of asymptotically normality of the ML estimators are presented considering the stress effects on the two scale parameters of the truncated GLD with a k-level constant-stress ALT under progressive type-I censored grouped data. The EM algorithm method is used to obtain the estimators of the unknown parameters. In addition, estimator of the two scale parameters, reliability function under usual conditions and Fisher information matrix of the estimators are given. Finally, we present a Simulation Study to illustrate the proposed procedure.

Highlights

With today’s highly reliable components, we are often unable to obtain a reasonable amount of test data under normal use condition
The Generalized Logistic Distribution (GLD) is considered inappropriate for modeling lifetime data because left hand side of its distribution extends to negative infinity, and this could conceivably result in modeling negative times-to-failure
This has necessitated the use of truncated GLD truncated at point zero for modeling lifetime data

Summary

Introduction

With today’s highly reliable components, we are often unable to obtain a reasonable amount of test data under normal use condition. For this reason, ALT is the reasonable procedure to be applied. CSALT is the most comely adopted ALT so that it is the easiest way to run and estimate reliability information for high reliability and long lifetime products under usual conditions. There is abundant literature on how to design CSALT They differ in the assumed lifetime distribution, censoring scheme, and test condition. Meeker and Hahn (1977) considered optimal allocation of test units to accelerated stress conditions with the objective of minimizing the estimate of the product reliability under usual condition. Nelson (1990) reviewed statistically optimal and compromise plans for the single stress ALT planning

Methods

Results

Conclusion