Abstract
A method to determine selectively the lattice parameters and the strain in multilayers is developed, based on x-ray diffraction, using two wavelengths close to the absorption edges of different elements. This allows for a complementary suppression of the constituent materials in the multilayer. The method is applied to a study of single crystal multilayers of EuSe and PbSeTe grown by solid source molecular-beam epitaxy. The enhancement of the chemical contrast by anomalous x-ray diffraction and the high resolution is exploited to achieve a sensitivity for interdiffusion on an angstrom scale.
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