Strain-balanced InAs/GaSb superlattices used for the detection of VLWIR radiation

Abstract

This work reports on the impact of defects on the parameters of type II InAs/GaSb superlattices (SLs) and photoconductors (PCs) from the very long wavelength infrared region. SLs were grown by means of molecular beam epitaxy and characterised using microscopes, high-resolution X-ray diffractometry (HRXRD) and low-temperature photoluminescence (LT-PL). PCs were investigated using Fourier-transform infrared spectroscopy and a current–voltage measurements. The basic technological parameters were optimised using 30-period SLs. Tests on the growth temperature showed that different defect types dominated in SL samples of different thicknesses. The diffuse scattering in reciprocal space maps (RSMs) taken for 200-period SLs was the mirror image of that for 30-period SLs. Scanning electron microscope (SEM) images of 200 period SLs revealed three types of defects: holes, slits and others not belonging to the first two groups. Slits were the predominant type. The diameter of the defects determined by SEM and HRXRD was about 2.5 μm. The cross section along the defects was made using focus-ion beam technique. The investigations using high-resolution transmission electron microscopy revealed the origins of the defects: holes were formed at the SL/buffer interface and propagated throughout entire SL, while slits were created in the volume of the SL without disturbing the surrounding crystal lattice. The lowest defect density was found for an SL grown at 425 °C. The highest overall crystal quality, measured using an HRXRD rocking curve, was obtained for an SL deposited at 405 °C, while the highest optical quality was determined for an SL at 445 °C by means of LT-PL. The best parameters were achieved for PCs grown at two lower temperatures. The difference in the effective bandgaps of the PCs made it difficult to determine the optimal value of the growth temperature. The effective bandgap for three PCs was determined based on the spectral dependences of the photoresponse measured at 20 K. Activation energies for high (150–300 K) and low (<50 K) temperature ranges were estimated from R(1000/T) dependence.