Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs

Abstract

A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented. The statistical behavior of the circuits is described as a set of stochastic differential equations rather than estimated by a population of realizations and Gaussian closure approximations are introduced to obtain a closed form of moment equations. Statistical simulation of specific circuits shows that the proposed numerical methods offer accurate and efficient solution of stochastic differentials for variability and noise analysis of integrated circuits.