Abstract
Nanowires with dimensions of few nanometers were formed on the whole etched surface. The optical analysis of silicon nanostructures was studied. Blue shift luminescence was observed at 660nm for PS produced by electrochemical etching, and at 629nm for laser-induced etching. PS produced a blue shift at 622nm using both etching procedures simultaneously. X-ray diffraction (XRD) was used to investigate the crystallites size of PS as well as to provide an estimate of the degree of crystallinty of the etched sample. Refractive index, optical dielectric constant, bulk modulus and elasticity are calculated to investigate the optical and stiffness properties of PS nanowires, respectively. The elastic constants and the short-range force constants of PS are investigated.
Published Version
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