Abstract
AbstractRE‐Au‐Si (RE=Ho, Tb) systems are 1/1 Tsai‐type quasicrystalline approximants with a cluster center decoration that can vary from a disordered tetrahedron to a rare‐earth atom. The local atomic structure of three different samples was observed by scanning transmission electron microscopy and interpreted in the light of high‐angle annular dark field simulated scanning transmission electron microscopy images. It is found that the combination of these two methods allows to identify differences in the chemical decoration of the cluster centers through quantitative analysis of line profiles.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
