Abstract
This paper discusses statistical properties of electromagnetic (EM) wave propagation along random rough surface (RRS). RRS is generated by the convolution method which employs the amplitude spectrum density function expressed in an analytical form and characterized by the standard height deviation do and the correlation length cl of RRS. Ensemble average of EM field distributions along RRSs is computed by discrete ray tracing method (DRTM), and it is, in a least square sense, matched with the 1-ray model characterized by the amplitude modification factor alpha and the propagation oder of distance beta. Numerical calculations are carried out to investigate the relationship between the 1-ray parameters, alpha and beta, and the RRS parameters, dv and cl. The frequency dependence of the RRS parameters is also investigated.
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