Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs

Ya-Hsiang Tai Ya-Hsiang Tai,Yan-Fu Kuo Yan-Fu Kuo

doi:10.1109/leos.2005.1548311

Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs

Ya-Hsiang Tai Ya-Hsiang Tai, Yan-Fu Kuo Yan-Fu Kuo

https://doi.org/10.1109/leos.2005.1548311

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Publication Date: Jan 1, 2005

Affiliation: National Yang Ming Chiao Tung University

#Low Temperature Poly-silicon Thin Film #Temperature Poly-silicon Thin Film Transistor + Show 8 more

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Abstract

In this paper, the device variation and temperature dependence are crosschecked to analyze the turn-on characteristics of p-type low temperature poly-silicon thin film transistor (LTPS TFTs) statistically. The investigation into the common and device-dependent thermal behaviors is helpful to develop the active matrix organic light emitting diodes (AMOLED) model with temperature effects.

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