Abstract
A quantitative statistical study was done on digitized atomic force microscope (AFM) images of La2/3Ca1/3MnO3 thin films grown on (001) oriented SrTiO3 substrates. The films were grown via sputtering technique at high oxygen pressures and at substrate temperatures of 850 �C. The films where characterized by resistivity measurements to determine the transition temperature from insulating to metallic phase. By using a specific self-designed algorithm, we can extract from digitized AFM-images the quantitative values of roughness parameters, i.e., interface width, correlation length, and roughness exponent. Herein, we report layer thickness and image size dependence of the parameters describing roughness. (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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