Statistical checking of logic circuits with arbitrary input signal flux

Abstract

The history of the development of computer hardware testifies that the complexity of computer logic circuits has a constant tendency to grow. At the same time, all of the tasks connected with providing their error-free operation become substantially more complicated, which leads to a rapid development of .methods for investigating the reliability of logic circuits and methods for test and diagnosis of failures. The most widely developed are methods of testing based on the use of tests [1], i.e., predefined signal sequences that are applied to the inputs of the tested circuits. However, as noted by many authors (cf., e.g., [2]), in a number of cases it is impossible to bring the circuit, the object of the test, to an autonomous regime, in which the possibility will exist of conducting various kinds of experiments on it. In these situations it is necessary to conduct the test in a nonautonomous regime, where the input signals of the tested block are defined in each (or almost each) cycle by processes not under the control of the test instrument. Naturally, in this case the checking methods must rely only on the most general assumptions with regard to the character of the input signals of the tested block.