Abstract
The step stress accelerated life test is the selection of a set of accelerated stress levels that are higher than normal stress levels. At the beginning of the test, a certain number of samples are placed under a certain stress level for life testing. After some time, the stress level is increased, and this continues until a certain number of samples fail. In this paper, the acceleration coefficient is used to convert the failure data under each acceleration stress level into life data. The life distribution is exponential distribution, Weibull distribution, and logarithmic normal distribution. Under a certain number of samples, the statistical analysis of step stress accelerated life test data is completed, and the estimation of each reliability index is calculated.
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