Abstract
AbstractA review is presented of the use of static secondary ion mass spectrometry (SSIMS) and fast atom bombardment mass spectrometry (FABMS) in applied surface analysis. Some common criticisms of SIMS are discussed first, and then the experimental apparatus required is described briefly. Four main areas of application have been chosen: catalysts, polymers, glasses and metals, to illustrate the power of SSIMS/FABMS in characterising the chemical state of material surfaces. Finally the very new technique of SSIMS imaging has been described and some preliminary results presented, to indicate its potential in obtaining chemical state information at high spatial resolution.
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