Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

Abstract

Time-of-Flight (TOF) static secondary ion mass spectrometry (S-SIMS) was used to gain molecular information on the surface modifications introduced by plasma treatment of polypropylene (PP) films. A procedure using slotted electron microscopy grids was developed to deal with the charge build-up of samples with a thickness of about 30 μm. The surface composition was studied as a function of the plasma treatment time. A comparison of the mass spectra from untreated and treated PP showed significant differences of signal intensities of ions that could be specifically related to the presence of oxygen-containing species.