Abstract
An external (d.c.) electric field, applied across a metal/liquid interface, can shift the electronic levels of the metal surface. If not resolved properly, this effect can be problematic in voltage controlled surface studies, particularly in spectroscopy where photon induced interband transitions are active. A simple method, based on surface charge measurements by differential capacitance technique, is presented to account for such energy shifts. The technique is applied to estimate voltage induced shifts in the d-Fermi level transition threshold in the surface layer of a polycrystalline Cu electrode. The results are in striking agreement with those indicated by previously reported optical experiments on Cu.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
