Abstract

Intrinsic and extrinsic stacking faults along the $[111]$ direction in cubic SiC, Si, and C are studied within a first-principles scheme based on density-functional theory and the local-density approximation. In contrast to stacking fault energies for Si and C, we find them to be negative for SiC, possibly one part of the explanation for the large variety of hexagonal and rhombohedral polytypes. The formation energies are compared with experimental and theoretical data available and the chemical trends are derived for the geometrical changes. The electronic structure is calculated for the energetically favorable stacking faults in SiC.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.