Abstract
The effects of the background vacuum level and of atomic migration on the stability of pulsed-field emission have been investigated. Initial studies concerned the emission characteristics that depend on the emitter temperature. Then the effects of the bias field and the change of the emitter shape were considered, in order to clarify the optimum condition for long-term stability. Conclusions are: (i) the characteristics of atom migration on the hot cathode surface agreed well with the Dyke theory, (ii) the blunting of the emitter was successfully suppressed by applying an inverse bias field, (iii) long-term stability of emission was obtained under the conditions Fa=(4/3)12/F01, (iv) the emitter lifetime was not affected by the purity of the emitter material when the emitter radius was larger than 0.1 mu m and the peak current density was less than 1*1010 A cm-2.
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