Abstract
The surface stability of NdBa 2Cu 3O 7− x thin film is utudied using the conditions referred to as standard accelerated humidity testing. NdBa 2Cu 3O 7− x thin film is compared with well studied YBa 2Cu 3O 7− x thin film by evaluating the surface resistance ( R s) obtained from their film-based microstrip line resonators. The R s of the NdBa 2Cu 3O 7− x thin film indicates better stability than that of YBa 2Cu 3O 7− x in the low and relatively high microwave power range.
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