Abstract
AbstractThe electrical devices, where alkyd resin is used as insulation material must have an improved thermal stability. The added filler, inorganic oxide compounds, have various contributions on the resin durability because of their differences in the electronic distribution. The PbTiO3 doped with Mn, Ce, In, Gd, Nb, Pr, and Nd atoms possessing certain features of stabilization played the role of protector during material oxidation. The investigations by isothermal and nonisothermal chemiluminescence revealed the effect of filler in the alkyd resin matrices subjected to the accelerated degradation by γ‐irradiation. The influence of doping atoms is discussed and the stabilization consequences are evaluated.
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