Abstract
Synchrotron-based X-ray scattering (SR-XRS) techniques offer the ability to probe nano- and atomic-scale structure that dictates the properties of advanced technological and environmental materials. Important materials studied at the Stanford Synchrotron Radiation Lightsource (SSRL) include organic and inorganic thin films and interfaces, nanoparticles, monolayers, complex oxides, solutions, polymers, minerals, and poorly crystalline materials. Good planning and a working knowledge of beam lines and techniques are required to successfully conduct SR-XRS measurements. This fifth annual School at SSRL on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences, held at the SLAC National Accelerator Laboratory on June 1–3, 2010, provided a practical users' guide to planning and conducting scattering measurements at SSRL beam lines, with an emphasis on information that cannot be found in textbooks. More than 45 researchers, mostly graduate students and postdoctoral associates, participated in this workshop. Attendees represented a variety of fields including material sciences, chemical engineering, applied physics, environmental and earth sciences, and chemistry.
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