Abstract
Modern synchrotron-based X-ray scattering (SR-XRS) techniques offer the ability to probe nano- and atomic-scale structures, interfaces, and order/disorder relationships that govern the properties of advanced technological and environmental materials. Important materials studied at the Stanford Synchrotron Radiation Laboratory (SSRL) include thin films and interfaces, nanoparticles, amorphous materials, solutions, polymers, and bacteriogenic minerals. Good planning and a working knowledge of beam lines and techniques are required to successfully conduct SR-XRS measurements. This second annual School at SSRL on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences, held at the Stanford Linear Accelerator Center (SLAC) on May 15–17, 2007, provided a practical users' guide to planning and conducting scattering measurements at SSRL beam lines, with an emphasis on information that cannot be found in textbooks. More than 45 researchers, mostly graduate students and postdocs, participated in this crosscutting workshop. Attendees represented a variety of fields including material sciences, applied physics, environmental sciences, and chemistry.
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