SSML: Semi-supervised metric learning with hard samples for hyperspectral image classification

Abstract

Deep learning is widely used in hyperspectral image (HSI) classification due to its powerful learning capabilities. However, its excellent performance typically requires a large number of samples, which can be time-consuming and labor-intensive to produce. The limitation of available samples greatly constrains the model's generalization performance. To alleviate the sample pressure, we propose a semi-supervised metric learning method for HSI classification that focuses on hard samples and can obtain reliable pseudo-labels through multiscale prediction. Additionally, we employ a hard sample learning strategy for network training, which concentrates on enhancing network discrimination by adaptively optimizing intra-class and inter-class distances. Performance tests on three public datasets indicate that the proposed method surpasses other state-of-the-art methods across multiple validation metrics.