Abstract
X-ray fluorescence trace and micro analyses using a synchrotron radiation source are of value in both research and technology. The outstanding properties of SR which serve to enhance the capability of X-ray spectrochemical analysis are the tunability of the energy spectrum, high brightness, and polarization for reduced scattered background. The state of arts and the future capability of this synchrotron radiation excited X-ray fluorescence analysis are presented. Applications of this method to earth science and materials science are also discussed.
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