SRAM FPGAs single event upsets detection method based on selective readback

Abstract

The configuration memory of SRAM (Static Random Access Memory) FPGAs (Field Programmable Gate Arrays) is susceptible to SEUs (Single Event Upsets) induced by space radiation, which may result in logic errors and functional disruption of FPGAs. In order to improve the reliability of SRAM FPGAs in aerospace, the SEUs detection and repair of configuration memory are realized by the combination of readback and scrubbing, but the detection method of global readback has the problems of long detection period and low efficiency. In this paper, on the basis of analyzing the configuration memory and implement details of Xilinx SRAM FPGAs, A SEUs detection method based on selective readback is proposed. This method classifies the configuration bits in configuration memory and filters out the essential configuration bits that are used to compose the circuits, which avoids wasting time of detecting and repairing irrelevant configuration bits. What's more, this method reduces the total number of essential configuration frames by adding layout constraints. Finally, a demonstration system based on this method is built on XC7Z020. The effectiveness of the proposed method is verified by fault injection, and the efficiency of this method is highlighted by being compared with the detection method based on global readback.