Abstract
Squareness in polarization–electric field hysteresis loops of (100)-oriented epitaxial and fiber-textured rhombohedral Pb(Zr,Ti)O3 films prepared on (100) SrTiO3 and (100) Si substrates, respectively, was investigated as a function of temperature. The ratio of remanent polarization to saturation polarization (Pr/Psat) decreased with increasing temperature for all films. It depends on the kind of substrates and the remained strain in the in-plane orientation. These data suggest that the existing strain in the films possibly affects the temperature dependence of the Pr/Psat ratio.
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