Abstract
Several tens of chromium layers were deposited at250 °C on a Cr(001) surface and investigated by spin-polarized scanning tunneling microscopy(SP-STM), Auger electron spectroscopy (AES) and scanning tunneling spectroscopy (STS).Chromium is found to grow with a mound-like morphology resulting from the stacking ofseveral monolayers which do not uniformly cover the whole surface of the substrate. Theterminal plane consists of an irregular array of Cr islands with lateral sizes smaller than20 × 20 nm2. Combined AES and STS measurements reveal the presence of a significant amount ofsegregants prior to and after deposition. A detailed investigation of the surface shows thatit consists of two types of patches. Thanks to STS measurements, the two types of areahave been identified as being either chromium pure or segregant rich. SP-STM experimentshave evidenced that the antiferromagnetic layer coupling remains in the chromium moundsafter deposition and is not significantly affected by the presence of the segregants.
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