Spectrum-Based and Program Slicing Statistical Fault Localization

Abstract

Software fault localization is a necessary and time-consuming process in program debugging. An effective fault location method can help developers quickly locate faults and improve debug efficiency .In this paper, a new SIFL (Spectrum-Based Improved Fault Localization) method is proposed to improve the accuracy of fault location, by adding program slicing technology and test case selection technology to traditional spectrum-based fault localization. In the experimental section, this paper uses the public fault data set SIEMENT[1] to test the accuracy of the SIFL method. According to the experimental results, the SIFL method significantly improves the accuracy of fault location compared to SFL method. And using the SIFL method, the average fault location ratio is 3.076% of the program, which showing SIFL method can greatly narrow the scope of fault and improve debug efficiency.