Abstract
Spectroscopic ellipsometry (SE) was performed on CuIn Se 2 (CIS) thin films and solar cells with a goal toward optimizing this low bandgap absorber for tandem applications. The CIS thin films and the absorbers in devices were deposited by one-stage thermal co-evaporation on silicon and on Mo-coated soda-lime glass substrates in a deposition system that has yielded CuIn 1-x Ga x Se 2 (CIGS) cells with > 17% efficiency using standard thickness (2.0 μm)x = 0.3 absorbers and > 13% using 0.7 μm low-Ga absorbers. In this study, a mapping capability for CIS Cu stoichiometry y = [Cu]/[In] over the film area was established based on a y-dependent parametric dielectric function (e 1 , e 2 ) with bandgap critical point E g decreasing linearly from 1.030 eV for y = 0.7 to 1.016 eV for y = 1.1. In addition, a full set of (e 1 , e 2 ) spectra measured for the CIS cell components enables analysis of SE data in terms of an accurate structural model for the device. With this model, spectra in the external quantum efficiency can be predicted, and deviations from this prediction can be attributed to incomplete collection of photogenerated electrons and holes as simulated with a carrier collection profile.
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