Abstract

The effects of substrate temperature (Tsub) and film thickness (dCIT) on the properties of CuIn3Te5 thin films and solar cells were investigated. CuIn3Te5 thin films (dCIT = 1.8–4.0 μm) were grown on both bare and Mo-coated soda-lime glass substrates at Tsub of 250–400 °C by single-step co-evaporation using a molecular beam epitaxy system. The microstructural properties were examined using scanning electron microscopy and x-ray diffraction. Well-developed (112)-oriented CuIn3Te5 grains were obtained by increasing the dCIT for Tsub of 250 °C. Cathodoluminescence analysis and temperature-dependent Hall measurements indicate the formation of shallow defect levels in the CuIn3Te5 films grown at higher Tsub. An optimum solar cell fabricated using CuIn3Te5 thin films (Tsub = 250 °C, and dCIT = 4.0 μm) yielded a total area (0.504 cm2) efficiency of 6.28%. Recombination mechanisms in the CdS/CuIn3Te5 thin-film solar cells are discussed on the basis of the temperature-dependent electrical properties of the films and solar cells.

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