Abstract
An emission spectrographic method for the estimation of impurities of Al, As, Ba, Bi, Ca, Cd, Co, Cr, Cu, Fe, Hg, Mg, Mn, Mo, Ni, Pb, Sb, Sn, Te, Ti, V, Zn and Zr in high purity selenium at concentrations less than 1 ppm has been developed. The impurities were separated from 1 g of selenium by volatilizing Se from its solution in nitric acid and sulphuric acid. The residue containing impurities was dissolved in small amounts of 6 M HCl and loaded along with the washing on 10 mg mixture containing graphite (90%) and sodium chloride carrier (10%), in the electrode crater. The spectra were excited in a d.c. arc carrying 13 A. The detection limits lie in the range 0.005–0.5 ppm for the different elements. The precision of the method ranges from 7–18% for these elements.
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