Abstract
A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to ~10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si 3 N 4 ). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.
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