A self-referenced in-situ arrival time monitor for X-ray free-electron lasers.

Michael Diez,Tokushi Sato,Martin S Wagner,Ryan N Coffee,Takahiro Sato,Rupert Heider,Tetsuo Katayama,Andreas Galler,Makina Yabashi,Christian Bressler,Wolfram Helml,Nick Hartmann,Christina Boemer,Sebastian Schulz

doi:10.1038/s41598-021-82597-3

Abstract

We present a novel, highly versatile, and self-referenced arrival time monitor for measuring the femtosecond time delay between a hard X-ray pulse from a free-electron laser and an optical laser pulse, measured directly on the same sample used for pump-probe experiments. Two chirped and picosecond long optical supercontinuum pulses traverse the sample with a mutually fixed time delay of 970 fs, while a femtosecond X-ray pulse arrives at an instant in between both pulses. Behind the sample the supercontinuum pulses are temporally overlapped to yield near-perfect destructive interference in the absence of the X-ray pulse. Stimulation of the sample with an X-ray pulse delivers non-zero contributions at certain optical wavelengths, which serve as a measure of the relative arrival time of the X-ray pulse with an accuracy of better than 25 fs. We find an excellent agreement of our monitor with the existing timing diagnostics at the SACLA XFEL with a Pearson correlation value of 0.98. We demonstrate a high sensitivity to measure X-ray pulses with pulse energies as low as 30 upmu J. Using a free-flowing liquid jet as interaction sample ensures the full replacement of the sample volume for each X-ray/optical event, thus enabling its utility even at MHz repetition rate XFEL sources.

Highlights

We present a novel, highly versatile, and self-referenced arrival time monitor for measuring the femtosecond time delay between a hard X-ray pulse from a free-electron laser and an optical laser pulse, measured directly on the same sample used for pump-probe experiments
The width of the spectrum corresponds to the fixed time delay between both supercontinuum pulses governed by the thickness and rotation of the birefringent barium borate crystals, which in our case is 970 fs
Both the red and blue cut-off wavelengths deliver the same information about the relative arrival time of the X-ray pulse with respect to the supercontinuum pulse pair

Summary

Introduction

Highly versatile, and self-referenced arrival time monitor for measuring the femtosecond time delay between a hard X-ray pulse from a free-electron laser and an optical laser pulse, measured directly on the same sample used for pump-probe experiments. Additional diagnostic methods are used to measure the relative arrival time between the optical and X-ray pulses in order to minimise arrival time uncertainties, which cannot be removed These so-called timing tools are implemented at most XFEL beamlines and instruments[19,20,21,22] and allow determining the arrival time for each laser pump/X-ray probe event. Two straightforward techniques have been implemented at different XFEL facilities, known as spatial encoding and spectral encoding In both methods the X-ray pulse induces a change of the optical properties of a sample, such that the resulting change of transmission and reflectivity of an optical light pulse is used to determine the relative arrival time of the two pulses. The transient refractive index in the material induced by the X-ray pulse encodes the arrival time as a spectral feature, for example a step-like change of the transmitted laser spectrum at a specific wavelength[19,30,31]

Methods

Results

Conclusion