Abstract
Spectra of second-order Raman scattering in porous silicon are investigated. A band shift towards lower energies in second-order spectra is observed, as well as the correlation between the values of band shift in first-and second-order spectra. It is demonstrated that the observed effect cannot be interpreted using the conventional concepts of the mechanisms of scattering in microcrystalline samples. An interpretation of the revealed effect is suggested.
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