Abstract
We report the use of photo-electromotive-force effect in a speckled pattern of light onto a photorefractive Bi 12 TiO 20 crystal to measure the amplitude of transverse vibrations. Our theoretical model shows that, for vibrations much faster than the photorefractive response time, the photo-emf signal exhibits a maximum at a characteristic vibration amplitude value that may be used to calibrate the photo-emf sensor.
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