Abstract
Journal of Electron Microscopy TechniqueVolume 3, Issue 4 p. 457-458 Article Specimen holders for Hitachi SEMs W. C. Bigelow, W. C. Bigelow Department of Materials Science and Engineering The University of Michigan, Dow Bldg./Hayward St., Ann Arbor, Michigan 48109Search for more papers by this authorG. J. Brooks, G. J. Brooks Department of Materials Science and Engineering The University of Michigan, Dow Bldg./Hayward St., Ann Arbor, Michigan 48109Search for more papers by this authorH. W. Estry, H. W. Estry Department of Materials Science and Engineering The University of Michigan, Dow Bldg./Hayward St., Ann Arbor, Michigan 48109Search for more papers by this author W. C. Bigelow, W. C. Bigelow Department of Materials Science and Engineering The University of Michigan, Dow Bldg./Hayward St., Ann Arbor, Michigan 48109Search for more papers by this authorG. J. Brooks, G. J. Brooks Department of Materials Science and Engineering The University of Michigan, Dow Bldg./Hayward St., Ann Arbor, Michigan 48109Search for more papers by this authorH. W. Estry, H. W. Estry Department of Materials Science and Engineering The University of Michigan, Dow Bldg./Hayward St., Ann Arbor, Michigan 48109Search for more papers by this author First published: 1986 https://doi.org/10.1002/jemt.1060030410AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume3, Issue41986Pages 457-458 RelatedInformation
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