Abstract
The papers in this special issue focus on theory, measurements, and applications for electromagnetics in near-field. Numerous electromagnetic compatibility (EMC) problems occur in the near-field (NF) where far-field (FF) concepts, measurement techniques, and equipment may not provide correct insight and solutions. The ability to identify near-field effects when assessing EMC problems is important to both researchers and practitioners alike. Applications of advanced technologies, which are characterized by new materials and rapidly increasing frequencies, in different civil, industrial, and military areas highlight the importance of NF techniques. This issue examines recent research on NF theoretical approaches, computational models, and measurement techniques in light of EMC goals.
Published Version
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