Abstract
Spatially resolved ac susceptibility measurements on epitaxial Fe films are performed as a function of temperature using a conventional soft-x-ray photoelectron emission microscope. A magnetic contrast is observed at sample locations where the magnetic film undergoes a para/ferromagnetic phase transition. Due to the wedge structure of the Fe film and the thickness dependence of the Curie temperature the spatial extend of the phase transition region and the correlation length can be estimated.
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