Abstract
The spatial resolutions and polarization analysis in the Raman microprobe technique were dealt with. The spatial resolutions for the axial and the horizontal directions of high-numerical-aperture objectives in vacuum were estimated theoretically by the analysis of the spatial distribution of the incident electric field near the focal point. Based on the results, a method of correction for the polarization scrambling effect caused by the sharp focusing objective in the polarization analysis, which is a modification of the method derived by Turrell, was derived. This was applied successfully to the analysis of spectral change due to the shift of the focus in a specimen such as α-quartz.
Published Version
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