Abstract

Polyamide thin films were rapidly grown using spatial molecular layer deposition (MLD) in a rotating cylinder reactor. The polyamide MLD films were coated on flexible metalized polyethylene terephthalate substrates using sequential exposures of trimesoyl chloride (TMC) and m-phenylenediamine (mPD). The rotating cylinder reactor was housed in a custom oven enclosure that maintained a constant temperature of 115 °C. One MLD cycle (TMC/mPD) was performed per rotation of the cylinder. Polyamide growth rates of 4.5 Å/cycle or 90 Å/min were observed at a slow rotation speed of 20 revolutions per minute (RPM) at a substrate speed of 0.33 m/s. Growth rates of 2.27 Å/cycle or 477 Å/min were measured at higher rotation speeds of 210 RPM at substrate speeds of 3.5 m/s. The polyamide film thicknesses were uniform over the substrate widths as large as ∼16.5 cm. The polyamide MLD surface chemistry was also self-limiting. Constant polyamide growth rate per cycle was measured at larger TMC and mPD exposures. In addition, infrared analysis and thermal annealing studies confirmed the chemical identity of the polyamide films. With four MLD cycles per rotation of the rotating cylinder, spatial MLD should be able to obtain polymer growth rates of >1900 Å/min at a rotation speed of 210 RPM. These rapid growth rates are much higher than the growth rates that can be obtained in temporal MLD reactors. The spatial MLD of polyamide films has many possible applications including the deposition of ultrathin reverse osmosis membranes for water desalination.

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