Abstract
Injection profiled broad-area edge-emitting semiconductor lasers demonstrate single transverse mode operation and near-diffraction-limited beam output when driven by pulsed pump current. Thermal effects arising from CW operation induce filamentary dynamics, thus degrading the beam. Transition from the stable nonthermal to the unstable CW regime is analyzed experimentally and numerically, and techniques to improve beam quality in the thermal regime, based on feedback or thermal profiling, are proposed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
